
Reference: RBD-0907
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The TES200 is a digital IC tester designed primarily for testing 74 series and 40 series digitalICs. It simplifies the testing of logic integrations and allows the user to identify faulty logic gates. IC testing is selected through key operation.
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(edit with the Customer Reassurance module)
Product Selling Point:
Product Features:
The TES200 is a digital IC tester designed primarily for testing 74 series and 40 series digitalICs. It simplifies the testing of logic integrations and allows the user to identify faulty logic gates. IC testing is selected through key operation.
Product Application:
Technical Parameters:
Interface Description and Related Operations:
Key Description:
IC Models (74 series): 7400, 7401, 7402, 7403, 7404, 7405, 7406, 7407, 7408, 7409, 7410, 7411, 7412, 7413, 7414, 7415, 7416, 7417, 7418, 7419, 7420, 7421, 7422, 7424, 7425, 7426, 7427, 7428, 7430, 7432, 7433, 7434, 7435, 7436, 7437, 7438, 7439, 7440, 7442, 7443, 7444, 7445, 7446, 7447, 7448, 7454, 7464, 7470, 7472, 7473, 7474, 7475, 7476, 7477, 7478, 7480, 7482, 7483, 7485, 7486, 7487, 7489, 7494, 7495, 7496, 74101, 74102, 74103, 74107, 74108, 74109, 74112, 74113, 74125, 74126, 74128, 74130, 74132, 74133, 74134, 74135, 74136, 74137, 74138, 74139, 74140, 74145, 74147, 74148, 74151, 74152, 74153, 74155, 74156, 74157, 74158, 74160, 74161, 74163, 74164, 74165, 74166, 74171, 74173, 74174, 74175, 74176, 74177, 74180, 74182, 74190, 74191, 74192, 74193, 74194, 74195, 74197, 74242, 74243, 74247, 74248, 74249, 74251, 74253, 74256, 74257, 74258, 74259, 74260, 74266, 74279, 74280, 74283, 74290, 74293, 74295, 74298, 74350, 74352, 74353, 74365, 74366, 74367, 74368, 74375, 74378, 74379, 74390, 74393, 74395, 74425, 74426, 74445, 74447, 74490, 74595, 74670
IC Models (40, 45 series): CD4000, CD4001, CD4002, CD4006, CD4007, CD4008, CD4009, CD4010, CD4011, CD4012, CD4013, CD4014, CD4015, CD4016, CD4017, CD4018, CD4019, CD4020, CD4021, CD4022, CD4023, CD4024, CD4025, CD4026, CD4027, CD4028, CD4029, CD4030, CD4033, CD4035, CD4040, CD4042, CD4043, CD4044, CD4048, CD4049, CD4050, CD4051, CD4052, CD4053, CD4060, CD4066, CD4068, CD4069, CD4070, CD4071, CD4072, CD4073, CD4075, CD4076, CD4077, CD4078, CD4081, CD4082, CD4085, CD4093, CD4094, CD4099, CD4502, CD4503, CD4504, CD4510, CD4511, CD4512, CD4516, CD4518, CD4520, CD4522, CD4526, CD4529, CD4532, CD4539, CD4543, CD4555, CD4556, CD4584, CD40106, CD40110, CD40161, CD40162, CD40174, CD40175, CD40192, CD40193
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The TES200 is a digital IC tester designed primarily for testing 74 series and 40 series digitalICs. It simplifies the testing of logic integrations and allows the user to identify faulty logic gates. IC testing is selected through key operation.
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